Power Device Parameter Test
GRG Test actively operates the testing business of the third generation semiconductor power devices. We have introduced internationally advanced testing technology, so as to provide device parameter testing services for upstream and downstream enterprises in the power semiconductor industry, and promote the localization and high-tech development of devices. The test items include: static parameters, dynamic parameters, thermal characteristics, avalanche tolerance, short circuit characteristics and insulation withstand voltage test; and the equipment supports parameter tests of devices of 0-1500A and 0-3000V, covering MIL-STD-750, IEC 60747 series, GB/T29332 and other standards.