Screening of Electronic Components

Our Services Failure Analysis Screening of Electronic Components

Screening of Electronic Components

GRG Test has set up electronic component reliability business and can provide users with electronic components testing, evaluation, quality assurance of complete sets of schemes, covering various electronic components screening and testing items, which can eliminate unqualified components, improve the use reliability of electronic components, thus improving the quality and reliability of electronic equipment. Our services cover electrical performance tests, life/aging/burn-in tests, environmental/mechanical stress tests and other test items.

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Six-performance Design and Analysis

Service Introduction

The one-time screening projects and stress conditions conducted by component manufacturers can hardly meet the needs of equipment development; besides, there are often some industrial or medium and low-grade products and even possibly fake and substandard products in imported components, which makes it hard to ensure the quality and reliability of electronic equipment.

Test Cycle:

2-4 weeks, during which comprehensive screening and testing services for electronic components will be provided; and urgent services are available.

Product Scope:

resistor; capacitor; magnetic bead; inductor; transformer; crystal oscillator; crystal resonator; relay; semiconductor discrete devices (diode, triode, FET, Darlington array, semiconductor optoelectronic device, etc.); electric connector; switch and panel elements; semiconductor integrated circuit (time base circuit, bus transceiver, buffer, driver, level translator, gate device, trigger, LVDS line transceiver, operational amplifier, voltage regulator, voltage comparator, power chip (voltage regulator, switching power converter, power monitor, power management, etc.), digital to analog converter (A/D, D/A, SRD), memory, programmable logic device, single chip microcomputer, microprocessor, controller, etc.); filter; power module; IGBT, etc.

Test Items:

S/N	Test Items	Sample Quantity	Test Method
1	Visual inspection	As requested by customer	GJB128, GJB548, etc.
2	Electrical performance test: Normal temperature test/high temperature test/low temperature test	As requested by customer	GB or GJB test method GJB33、GJB63、GJB65、GJB1042、GJB1432、GJB1648、GJB2438、GJB2138、GJB597、 ……


3	Environmental/mechanical stress test: frequency sweep/random vibration, low temperature storage, high temperature storage, temperature cycle, temperature shock, constant acceleration or drop, sealing (coarse leak detection, fine leak detection), PIND	As requested by customer	GJB360、GJB128 、GJB548、 GJB33、GJB63、GJB65、GJB1042、GJB1432、GJB1648、GJB2438、GJB2138、GJB597、 ……


4	Life/aging/burn-in	As requested by customer	GJB360、GJB128、GJB548
5	Ultrasonic testing of chip bonding	As requested by customer	GJB548
6	X-ray radiography	As requested by customer	GJB360、GJB128、GJB548