S/N | Test Item | S/N | Test Item | S/N | Test Item |
1 | Temperature /humidity | 10 | Salt fog | 19 | Xenon lamp test |
2 | High temperature | 11 | Deluge | 20 | Ultraviolet irradiation |
3 | Damp-heat | 12 | Dust (dust control) test | 21 | Sunlight experiment |
4 | Low temperature | 13 | High altitude test (High altitude and low pressure test) | 22 | Optical fiber pressure test |
5 | Temperature cycle | 14 | Vibration | 23 | Optical fiber torsion test |
6 | Rapid temperature change | 15 | Drop | 24 | Crash test |
7 | Temperature shock (Thermal shock) | 16 | Impregnation | 25 | Gaseous corrosion |
8 | Highly accelerated screening test | 17 | Mechanical shock | ... | ... |
9 | Moisture resistance | 18 | Highly accelerated impact | ... | ... |
2. EMC Test
Test Item | Coverage Criteria |
Conducted emission (CE) |
CISPR 32/35(EN 55032/35)
ETSI 301 489 series
EN 300 386
IEC 61000-4-2/-3/-4/-5/-6/-8/-11/
IEC 61000-3-2/-3
ITU-T K.20/21(K.44/45)
GB 9254
GB 19286
YD/T 993
GB/T 17626.2/.3/.4/.5/.6/.8/.11
GB 17625.1/.2
|
Radiation emission (RE) | |
Electrostatic discharge immunity (ESD) | |
RF radiated immunity (RS) | |
Electrical fast transient immunity (EFT) test | |
Surge (impact) immunity Surge | |
Immunity to conducted disturbances, induced by radio-frequency fields (CS) | |
Power frequency magnetic field immunity (PFMF) | |
Pulse magnetic field immunity (PMF) | |
Voltage dips, short interruption and voltage variations immunity (DIP) |