Test Item | Test Capability | Test Item | Test Capability |
Conducted emission (CE) | 20Hz-108MHz | Low frequency magnetic field immunity | 10Hz-250kHz,180 dBuA/m |
Radiation emission (RE) | 20Hz-6GHz | Coupled conduction immunity | ISO7637-3 |
Transient conduction emission | DC1000V,2GHz/s | High/low voltage coupling | 150KHz-108MHz |
Low frequency magnetic field emission test (ME) | 10Hz-200KHz | Surge immunity | ±0.5KV-±6KV |
Low frequency electro-magnetic field emission test | 9kHz-30MHz | High/low voltage coupling HV to LV | 150KHz-108MHz |
Bulk current injection (BCI) | 10kHz-400MHz:300mA | Surge immunity | ±0.5KV-±6KV |
Radiation immunity of anechoic chamber method (RI) | 10kHz-6GHz:200V/m | Electrical fast transient/ immunity test | ±0.5KV-±4KV |
Electrostatic discharge immunity (ESD) | -30kV-30kV | AC port harmonic emission | Single-phase 32A and three-phase 75A |
Radiation immunity of portable transmitter | 26MHz-6GHz,50W | AC port voltage fluctuation and flicker | Single-phase 32A and three-phase 75A |
Transient conduction immunity | ISO7637-2 pulse1-5b | ISO7637-4 | Impulse B, C |