Service Category | Service Item |
Reliability verification of communication chip | Reliability verification of new product NPI import (PC/HAST/THB/HTSL). |
Chip level ESD (HBM/CDM/LU) test. | |
IPESD capability design verification | |
Aging life verification | |
Verification of process risk assessment | |
Electrical performance and functional test | Chip level test and three-temperature verification (Normal Temperature/low temperature/high temperature) |
Process quality evaluation | Competitive analysis |
PCB/PCBA microsection test | |
X-ray fluoroscopy testing | |
Analysis of batch damage of products | |
Failure analysis of SOC chip | Nondestructive testing analysis |
Electrical performance analysis | |
Sample failure analysis | |
Precision microscope analysis |