AEC-Q102 Product Test of Optoelectronic Devices

Our Services Failure Analysis AEC-Q102 Product Test of Optoelectronic Devices

AEC-Q102 Product Test of Optoelectronic Devices

AEC, composed of Ford, Chrysler and General Motors, has issued the reliability standard AEC-Q102 for optoelectronic devices, which sets strict test requirements for the reliability of optoelectronic devices and provides optoelectronic devices with high reliability and long service life for the main engine factory. The AEC-Q technical team of GRG Test has carried out a large number of AEC-Q test cases and accumulated rich certification test experience, which enables us to provide more professional and reliable test services. At the same time, we can also conduct environmental tests for LED, photodiode, transistor and laser devices.

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Customized Comprehensive Service of Environmental Protection Housekeeper

Service Introduction

Lamps serve as important components of the whole vehicle. However, the reliability test standards of lamps and their accessories are numerous and complicated, and the test standards vary from one main engine factory to another, thus causing poor universality of such standards.

Test Cycle:

2-3 months, during which comprehensive certification plan, testing and other services will be provided

Product Scope:

LED lamp beads, photodiodes, phototransistors, laser assemblies

Test Items:

S/N	Test Items	Abbreviation	Sample Number/Batch	Batch Number	Test Method
S/N	Test Items	Abbreviation	Sample Number/Batch	Batch Number	Test Method
1	Pre- and Post-Stress Electrical and Photometric Test	TEST	Test before and after all stress tests		User Specifications
2	Pre-conditioning	PC	Pretreat SMD products before WHTOL, TC and PTC tests		JESD22-A113
3	External Visual	EV	Test before and after each test, except DPA and dimensional tests.		JESD22-B101
4	Parametric Verification	PV	25	3 Note A	User specifications
5a	High Temperature Operating Life	HTOL1	26	3 Note B	JESD22-A108
5b	High Temperature Operating Life	HTOL2	26	3 Note B	JESD22-A108
5c	High Temperature Reverse Bias	HTRB	26	3 Note B	JESD22-A108
6a	Wet High Temperature Operating Life	WHTOL1	26	3 Note B	JESD22-A101
6b	Wet High Temperature Operating Life	WHTOL2	26	3 Note B	JESD22-A101
6c	High Humidity High Temperature Reverse Bias	H3TRB	26	3 Note B	JESD22-A101
7	Temperature Cycling	TC	26	3 Note B	JESD22-A104
8a	Power Temperature Cycling	PTC	26	3 Note B	JESD22-A105
8b	Intermittent Operational Life	IOL	26	3 Note B	MIL-STD-750-1 Method 1037
9	Low Temperature Operating Life	LTOL	26	3 Note B	JESD22-A108
10a	Electrostatic Discharge Human Body Model	HBM	10	3	JS-001
10b	Electrostatic Discharge Charged Device Model	CDM	10	3	AEC Q101-005
11	Destructive Physical Analysis	DPA	2/Test	1	Appendix 6
12	Physical Dimension	PD	10	3	JESD22-B100
13	Terminal Strength	TS	10	3	MIL-STD-750-2 Method 2036
14	Constant Acceleration	CA	10	3	MIL-STD-750-2 Method 2006
15	Vibration Variable Frequency	VVF			JEDEC JESD22-B103
16	Mechanical Shock	MS			JEDEC JESD22-B104
17	Hermeticity	HER			JESD22-A109
18a	Resistance to Solder Heat	RSH (-reflow)	10	3	Leaded：JESD22-A113、J-STD-020
18a	Resistance to Solder Heat	RSH (-reflow)	10	3	Lead-free：AEC-Q005
18b	Resistance to Solder Heat	RSH (-wave)	10	3	Lead：JESD22-B106
18b	Resistance to Solder Heat	RSH (-wave)	10	3	Lead-free：AEC-Q005
19	Solderability	SD	10	3	Lead：J-STD-002、JESD22-B102
19	Solderability	SD	10	3	Lead-free：AEC-Q005
20	Pulsed Operating Life	PLT	26	3	JESD22-A108
21	Dew	DEW	26	3	JESD22-A100
22	Hydrogen Sulphide	H2S	26	3	IEC 60068-2-43
23	Flowing Mixed Gas	FMG	26	3	IEC 60068-2-60 Test method 4
24	Thermal Resistance	TR	10	1	JESD51-50、JESD51-51、JESD51-52
25	Wire Bond Pull	WBP	10	3	MIL-STD-750-2 Method 2037
26	Wire Bond Shear	WBS	10	3	AEC Q101-003
27	Die Shear	DS	5	3	MIL-STD-750-2 Method 2017
28	Whister Growth	WG	/	/	AEC Q005

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